Digital System On-Chip Electro-Migration relation to Power
February 4, 2021
Electro-migration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms. The effect is important in applications where high direct current densities are used, such as in microelectronics and related structures. As the structure size in electronics such as integrated circuits (ICs) decreases, the practical significance of this effect increases. Electro-Migration is a secondary effect of power being distributed […]